| 图片 | 厂商料号 | 库存情况 | 价格 | 数量 | 数据表 | 系列 | 封装/外壳 | 包装 | 产品状态 | 技术 | 电压 - 直流反向 (Vr)(最大值) | 电压 - 正向 (Vf)(最大值)@ If | 速度 | 反向恢复时间 (trr) | 电流 - 反向漏电 @ Vr | 电容 @ Vr, F | 电流 - 平均整流(Io) | 等级 | 认证 | 安装类型 | 供应商设备封装 | 工作温度 - 结点 |
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
|
NXPSC046506QDIODE SIL CARB 650V 4A TO220AC WeEn Semiconductors |
20,200 | - |
|
数据表 |
- | TO-220-2 | Tube | Obsolete | SiC (Silicon Carbide) Schottky | 650 V | 1.7 V @ 4 A | No Recovery Time > 500mA (Io) | 0 ns | 170 µA @ 650 V | 130pF @ 1V, 1MHz | 4A | - | - | Through Hole | TO-220AC | 175°C (Max) |
|
NXPSC04650X6QDIODE SIL CARBIDE 650V 4A TO220F WeEn Semiconductors |
2,826 | - |
|
数据表 |
- | TO-220-2 Full Pack, Isolated Tab | Tube | Obsolete | SiC (Silicon Carbide) Schottky | 650 V | 1.7 V @ 4 A | No Recovery Time > 500mA (Io) | 0 ns | 170 µA @ 650 V | 130pF @ 1V, 1MHz | 4A | - | - | Through Hole | TO-220F | 175°C (Max) |
|
NXPSC04650B6JDIODE SIL CARBIDE 650V 4A D2PAK WeEn Semiconductors |
3,090 | - |
|
数据表 |
- | TO-263-3, D2PAK (2 Leads + Tab), TO-263AB | Tape & Reel (TR) | Obsolete | SiC (Silicon Carbide) Schottky | 650 V | 1.7 V @ 4 A | No Recovery Time > 500mA (Io) | 0 ns | 170 µA @ 650 V | 130pF @ 1V, 1MHz | 4A | - | - | Surface Mount | D2PAK | 175°C (Max) |
|
BYV60W-600PQDIODE GEN PURP 600V 60A TO247-2 WeEn Semiconductors |
4,084 | - |
|
数据表 |
- | TO-247-2 | Tube | Active | Standard | 600 V | 2 V @ 60 A | Fast Recovery =< 500ns, > 200mA (Io) | 55 ns | 10 µA @ 600 V | - | 60A | - | - | Through Hole | TO-247-2 | 175°C (Max) |
|
WNSC2D08650DJDIODE SIL CARBIDE 650V 8A DPAK WeEn Semiconductors |
7,463 | - |
|
数据表 |
- | TO-252-3, DPAK (2 Leads + Tab), SC-63 | Tape & Reel (TR) | Active | SiC (Silicon Carbide) Schottky | 650 V | 1.7 V @ 8 A | No Recovery Time > 500mA (Io) | 0 ns | 40 µA @ 650 V | 260pF @ 1V, 1MHz | 8A | - | - | Surface Mount | DPAK | 175°C |
|
BYQ60W-600PT2QDIODE GEN PURP 600V 60A TO247-2 WeEn Semiconductors |
569 | - |
|
数据表 |
- | TO-247-2 | Tube | Active | Standard | 600 V | 2 V @ 60 A | Fast Recovery =< 500ns, > 200mA (Io) | 55 ns | 10 µA @ 600 V | - | 60A | - | - | Through Hole | TO-247-2 | 175°C |
|
BYV60W-600PT2QDIODE GEN PURP 600V 60A TO247-2 WeEn Semiconductors |
468 | - |
|
数据表 |
- | TO-247-2 | Tube | Active | Standard | 600 V | 1.7 V @ 60 A | Fast Recovery =< 500ns, > 200mA (Io) | 79 ns | 10 µA @ 600 V | - | 60A | - | - | Through Hole | TO-247-2 | 175°C |
|
WNSC2D10650QDIODE SIL CARB 650V 10A TO220AC WeEn Semiconductors |
995 | - |
|
数据表 |
- | TO-220-2 | Tube | Active | SiC (Silicon Carbide) Schottky | 650 V | 1.7 V @ 10 A | No Recovery Time > 500mA (Io) | 0 ns | 50 µA @ 650 V | 310pF @ 1V, 1MHz | 10A | - | - | Through Hole | TO-220AC | 175°C |
|
WNSC6D166506QDIODE SIL CARB 650V 16A TO220AC WeEn Semiconductors |
2,976 | - |
|
数据表 |
- | TO-220-2 | Tube | Active | SiC (Silicon Carbide) Schottky | 650 V | 1.45 V @ 16 A | No Recovery Time > 500mA (Io) | 0 ns | 80 µA @ 650 V | 780pF @ 1V, 1MHz | 16A | - | - | Through Hole | TO-220AC | 175°C |
|
BYC30W-600PT2QDIODE GEN PURP 600V 30A TO247-2 WeEn Semiconductors |
1,787 | - |
|
数据表 |
- | TO-247-2 | Bulk | Active | Standard | 600 V | 2.75 V @ 30 A | Fast Recovery =< 500ns, > 200mA (Io) | 34 ns | 10 µA @ 600 V | - | 30A | - | - | Through Hole | TO-247-2 | 175°C (Max) |