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制造商 系列 封装/外壳 包装 产品状态 技术 电压 - 直流反向 (Vr)(最大值) 电压 - 正向 (Vf)(最大值)@ If 速度 反向恢复时间 (trr) 电流 - 反向漏电 @ Vr 电容 @ Vr, F 电流 - 平均整流(Io) 等级 认证 安装类型 供应商设备封装 工作温度 - 结点

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图片 厂商料号 库存情况 价格 数量 数据表 系列 封装/外壳 包装 产品状态 技术 电压 - 直流反向 (Vr)(最大值) 电压 - 正向 (Vf)(最大值)@ If 速度 反向恢复时间 (trr) 电流 - 反向漏电 @ Vr 电容 @ Vr, F 电流 - 平均整流(Io) 等级 认证 安装类型 供应商设备封装 工作温度 - 结点
BYC75W-600PQ

BYC75W-600PQ

DIODE GEN PURP 600V 75A TO247-2

WeEn Semiconductors

851 -
BYC75W-600PQ

数据表

- TO-247-2 Tube Active Standard 600 V 2.75 V @ 75 A Fast Recovery =< 500ns, > 200mA (Io) 50 ns 10 µA @ 600 V - 75A - - Through Hole TO-247-2 175°C (Max)
WNSC2D101200WQ

WNSC2D101200WQ

DIODE SIL CARB 1.2KV 10A TO247-2

WeEn Semiconductors

2,317 -
WNSC2D101200WQ

数据表

- TO-247-2 Tube Active SiC (Silicon Carbide) Schottky 1200 V 1.65 V @ 10 A No Recovery Time > 500mA (Io) 0 ns 110 µA @ 1200 V 490pF @ 1V, 1MHz 10A - - Through Hole TO-247-2 175°C
WNSC2D08650TJ

WNSC2D08650TJ

DIODE SIL CARBIDE 650V 8A 5DFN

WeEn Semiconductors

8,039 -
WNSC2D08650TJ

数据表

- 4-VSFN Exposed Pad Tape & Reel (TR) Active SiC (Silicon Carbide) Schottky 650 V 1.7 V @ 8 A No Recovery Time > 500mA (Io) 0 ns 40 µA @ 650 V 260pF @ 1V, 1MHz 8A - - Surface Mount 5-DFN (8x8) 175°C
NXPSC08650D6J

NXPSC08650D6J

DIODE SIL CARBIDE 650V 8A DPAK

WeEn Semiconductors

7,184 -
NXPSC08650D6J

数据表

- TO-252-3, DPAK (2 Leads + Tab), SC-63 Tape & Reel (TR) Obsolete SiC (Silicon Carbide) Schottky 650 V 1.7 V @ 8 A No Recovery Time > 500mA (Io) 0 ns 230 µA @ 650 V 260pF @ 1V, 1MHz 8A - - Surface Mount DPAK 175°C (Max)
NXPSC086506Q

NXPSC086506Q

DIODE SIL CARB 650V 8A TO220AC

WeEn Semiconductors

3,000 -
NXPSC086506Q

数据表

- TO-220-2 Tube Obsolete SiC (Silicon Carbide) Schottky 650 V 1.7 V @ 8 A No Recovery Time > 500mA (Io) 0 ns 230 µA @ 650 V 260pF @ 1V, 1MHz 8A - - Through Hole TO-220AC 175°C (Max)
NXPSC08650X6Q

NXPSC08650X6Q

DIODE SIL CARBIDE 650V 8A TO220F

WeEn Semiconductors

2,926 -
NXPSC08650X6Q

数据表

- TO-220-2 Full Pack, Isolated Tab Tube Obsolete SiC (Silicon Carbide) Schottky 650 V 1.7 V @ 8 A No Recovery Time > 500mA (Io) 0 ns 230 µA @ 650 V 260pF @ 1V, 1MHz 8A - - Through Hole TO-220F 175°C (Max)
BYC75W-1200PQ

BYC75W-1200PQ

DIODE GEN PURP 1.2KV 75A TO247-2

WeEn Semiconductors

9,568 -
BYC75W-1200PQ

数据表

- TO-247-2 Tube Active Standard 1200 V - Fast Recovery =< 500ns, > 200mA (Io) 85 ns 250 µA @ 1200 V - 75A - - Through Hole TO-247-2 175°C (Max)
WNSC2D201200W6Q

WNSC2D201200W6Q

DIODE SIL CARB 1.2KV 20A TO247-2

WeEn Semiconductors

2,379 -
WNSC2D201200W6Q

数据表

- TO-247-2 Tube Active SiC (Silicon Carbide) Schottky 1200 V 1.8 V @ 20 A No Recovery Time > 500mA (Io) 0 ns 200 µA @ 1200 V 845pF @ 1V, 1MHz 20A - - Through Hole TO-247-2 175°C
NXPSC08650B6J

NXPSC08650B6J

DIODE SIL CARBIDE 650V 8A D2PAK

WeEn Semiconductors

3,160 -
NXPSC08650B6J

数据表

- TO-263-3, D2PAK (2 Leads + Tab), TO-263AB Tape & Reel (TR) Obsolete SiC (Silicon Carbide) Schottky 650 V 1.7 V @ 8 A No Recovery Time > 500mA (Io) 0 ns 230 µA @ 650 V 260pF @ 1V, 1MHz 8A - - Surface Mount D2PAK 175°C (Max)
WNSC6D16650B6J

WNSC6D16650B6J

DIODE SIL CARBIDE 650V 16A D2PAK

WeEn Semiconductors

2,665 -
WNSC6D16650B6J

数据表

- TO-263-3, D2PAK (2 Leads + Tab), TO-263AB Tape & Reel (TR) Active SiC (Silicon Carbide) Schottky 650 V 1.45 V @ 16 A No Recovery Time > 500mA (Io) 0 ns 80 µA @ 650 V 780pF @ 1V, 1MHz 16A - - Surface Mount D2PAK 175°C
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