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制造商 系列 封装/外壳 包装 产品状态 技术 电压 - 直流反向 (Vr)(最大值) 电压 - 正向 (Vf)(最大值)@ If 速度 反向恢复时间 (trr) 电流 - 反向漏电 @ Vr 电容 @ Vr, F 电流 - 平均整流(Io) 等级 认证 安装类型 供应商设备封装 工作温度 - 结点

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图片 厂商料号 库存情况 价格 数量 数据表 系列 封装/外壳 包装 产品状态 技术 电压 - 直流反向 (Vr)(最大值) 电压 - 正向 (Vf)(最大值)@ If 速度 反向恢复时间 (trr) 电流 - 反向漏电 @ Vr 电容 @ Vr, F 电流 - 平均整流(Io) 等级 认证 安装类型 供应商设备封装 工作温度 - 结点
NXPSC206506Q

NXPSC206506Q

DIODE SIL CARB 650V 20A TO220AC

WeEn Semiconductors

3,041 -
NXPSC206506Q

数据表

- TO-220-2 Tube Obsolete SiC (Silicon Carbide) Schottky 650 V 1.7 V @ 20 A No Recovery Time > 500mA (Io) 0 ns 500 µA @ 650 V 600pF @ 1V, 1MHz 20A - - Through Hole TO-220AC 175°C (Max)
WNSC2D30650WQ

WNSC2D30650WQ

SILICON CARBIDE SCHOTTKY DI

WeEn Semiconductors

275 -
WNSC2D30650WQ

数据表

- TO-247-2 Tube Active SiC (Silicon Carbide) Schottky 650 V 1.7 V @ 30 A No Recovery Time > 500mA (Io) 0 ns 100 µA @ 650 V 980pF @ 1V, 1MHz 30A - - Through Hole TO-247-2 175°C
WNSC6D20650WQ

WNSC6D20650WQ

DIODE SIL CARB 650V 20A TO247-2

WeEn Semiconductors

484 -
WNSC6D20650WQ

数据表

- TO-247-2 Tube Active SiC (Silicon Carbide) Schottky 650 V 1.4 V @ 20 A No Recovery Time > 500mA (Io) 0 ns 100 µA @ 650 V 1200pF @ 1V, 1MHz 20A - - Through Hole TO-247-2 175°C
WNSC2D201200WQ

WNSC2D201200WQ

DIODE SIL CARB 1.2KV 20A TO247-2

WeEn Semiconductors

2,391 -
WNSC2D201200WQ

数据表

- TO-247-2 Tube Active SiC (Silicon Carbide) Schottky 1200 V 1.8 V @ 20 A No Recovery Time > 500mA (Io) 0 ns 200 µA @ 1200 V 845pF @ 1V, 1MHz 20A - - Through Hole TO-247-2 175°C
BYC100W-1200PQ

BYC100W-1200PQ

DIODE GP 1.2KV 100A TO247-2

WeEn Semiconductors

6,606 -
BYC100W-1200PQ

数据表

EEPP™ TO-247-2 Tube Active Standard 1200 V 3.3 V @ 100 A Fast Recovery =< 500ns, > 200mA (Io) 90 ns 250 µA @ 1200 V - 100A - - Through Hole TO-247-2 175°C (Max)
WNSC2D301200W6Q

WNSC2D301200W6Q

WNSC2D301200W/TO247-2L/STANDARD

WeEn Semiconductors

9,578 -
WNSC2D301200W6Q

数据表

- TO-247-2 Bulk Active SiC (Silicon Carbide) Schottky 1200 V 1.6 V @ 30 A No Recovery Time > 500mA (Io) 0 ns 150 µA @ 1200 V 1407pF @ 1V, 1MHz 30A - - Through Hole TO-247-2 -55°C ~ 175°C
WNSC2D401200W6Q

WNSC2D401200W6Q

WNSC2D401200W/TO247-2L/STANDARD

WeEn Semiconductors

9,449 -
WNSC2D401200W6Q

数据表

- TO-247-2 Bulk Active SiC (Silicon Carbide) Schottky 1200 V 1.6 V @ 40 A No Recovery Time > 500mA (Io) 0 ns 200 µA @ 1200 V 2068pF @ 1V, 1MHz 40A - - Through Hole TO-247-2 -55°C ~ 175°C
WBST080SCM120CGALW

WBST080SCM120CGALW

WBST080SCM120CGAL/NAU000/NO MARK

WeEn Semiconductors

4,318 -
WBST080SCM120CGALW

数据表

- - Bulk Active - - - - - - - - - - - - -
BYV10MX-600PQ

BYV10MX-600PQ

DIODE GEN PURP 600V 10A TO220F

WeEn Semiconductors

38 -
BYV10MX-600PQ

数据表

- TO-220-2 Full Pack, Isolated Tab Tube Active Standard 600 V 2 V @ 10 A Fast Recovery =< 500ns, > 200mA (Io) 35 ns 10 µA @ 600 V - 10A - - Through Hole TO-220F 175°C
BYC5DX-500,127

BYC5DX-500,127

DIODE GEN PURP 500V 5A TO220FP

WeEn Semiconductors

1,000 -
BYC5DX-500,127

数据表

* TO-220-2 Full Pack, Isolated Tab Bulk Active Standard 500 V 2 V @ 5 A Fast Recovery =< 500ns, > 200mA (Io) 16 ns 40 µA @ 500 V - 5A - - Through Hole TO-220FP 150°C (Max)
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