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| 图片 | 厂商料号 | 库存情况 | 价格 | 数量 | 数据表 | 系列 | 封装/外壳 | 包装 | 产品状态 | 逻辑类型 | 电源电压 | 工作温度 | 等级 | 认证 | 安装类型 | 供应商设备封装 | 位数 |
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
|
SN74ABT8652DLRIC SCAN TEST DEVICE 28-SSOP Texas Instruments |
0 | - |
|
数据表 |
74ABT | 28-BSSOP (0.295", 7.50mm Width) | Tape & Reel (TR) | Obsolete | Scan Test Device with Bus Transceiver and Registers | 4.5V ~ 5.5V | -40°C ~ 85°C | - | - | Surface Mount | 28-BSSOP | 8 |
|
SN74ABT8543DWRG4IC SCAN TEST DEVICE 28SOIC Texas Instruments |
0 | - |
|
数据表 |
74ABT | 28-SOIC (0.295", 7.50mm Width) | Tape & Reel (TR) | Obsolete | Scan Test Device with Registered Bus Transceiver | 4.5V ~ 5.5V | -40°C ~ 85°C | - | - | Surface Mount | 28-SOIC | 8 |
|
|
SN74ABT8646DWRG4IC SCAN TEST DEVICE 28SOIC Texas Instruments |
0 | - |
|
数据表 |
74ABT | 28-SOIC (0.295", 7.50mm Width) | Tape & Reel (TR) | Obsolete | Scan Test Device with Bus Transceiver and Registers | 4.5V ~ 5.5V | -40°C ~ 85°C | - | - | Surface Mount | 28-SOIC | 8 |
|
|
SN74ABT8652DWRG4IC SCAN TEST DEVICE 28SOIC Texas Instruments |
0 | - |
|
数据表 |
74ABT | 28-SOIC (0.295", 7.50mm Width) | Tape & Reel (TR) | Obsolete | Scan Test Device with Bus Transceiver and Registers | 4.5V ~ 5.5V | -40°C ~ 85°C | - | - | Surface Mount | 28-SOIC | 8 |
|
SN74SSTUB32864NMJRIC CONFIG REG BUFF 25BIT 96-BGA Texas Instruments |
0 | - |
|
数据表 |
74SSTUB | 96-LFBGA | Tape & Reel (TR) | Active | Configurable Registered Buffer | 1.7V ~ 1.9V | -40°C ~ 85°C | - | - | Surface Mount | 96-NFBGA (13.5x5.5) | 25, 14 |
|
|
SN74ABT8646DLRIC SCAN TEST DEVICE 28-SSOP Texas Instruments |
0 | - |
|
数据表 |
74ABT | 28-BSSOP (0.295", 7.50mm Width) | Tape & Reel (TR) | Active | Scan Test Device with Bus Transceiver and Registers | 4.5V ~ 5.5V | -40°C ~ 85°C | - | - | Surface Mount | 28-BSSOP | 8 |
|
LM9779CCVS/NOPBIC DATA CONVERSION Texas Instruments |
0 | - |
|
数据表 |
* | - | Tray | Active | - | - | - | - | - | - | - | - |
|
SN74BCT8374ANTG4IC SCAN TEST DEVICE W/FF 24-DIP Texas Instruments |
0 | - |
|
数据表 |
74BCT | 24-DIP (0.300", 7.62mm) | Tube | Obsolete | Scan Test Device with D-Type Edge-Triggered Flip-Flops | 4.5V ~ 5.5V | 0°C ~ 70°C | - | - | Through Hole | 24-PDIP | 8 |
|
SN74SSQEB32882ZALRIC REGSTR BUFFER 28-56BIT 176BGA Texas Instruments |
0 | - |
|
数据表 |
74SSQEB | 176-TFBGA | Tape & Reel (TR) | Active | 1:2 Registered Buffer with Parity | 1.25V, 1.35V, 1.5V | - | - | - | Surface Mount | 176-NFBGA (13.5x8) | 28, 56 |
|
SN74LVT8980ADWRG4IC TEST-BUS CONTROLLER 24-SOIC Texas Instruments |
0 | - |
|
数据表 |
74LVT | 24-SOIC (0.295", 7.50mm Width) | Tape & Reel (TR) | Discontinued at Digi-Key | Embedded Test-Bus Controllers | 2.7V ~ 3.6V | -40°C ~ 85°C | - | - | Surface Mount | 24-SOIC | 8 |
