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| 图片 | 厂商料号 | 库存情况 | 价格 | 数量 | 数据表 | 系列 | 封装/外壳 | 包装 | 产品状态 | 逻辑类型 | 电源电压 | 工作温度 | 等级 | 认证 | 安装类型 | 供应商设备封装 | 位数 |
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
|
74GTLP2034DGGRE4IC 8BIT REGIST TXRX 48-TSSOP Texas Instruments |
0 | - |
|
数据表 |
74GTLP | 48-TFSOP (0.240", 6.10mm Width) | Tape & Reel (TR) | Obsolete | LVTTL-TO-GTLP Adjustable-Edge-Rate Registered Transceiver | 3.15V ~ 3.45V | -40°C ~ 85°C | - | - | Surface Mount | 48-TSSOP | 8 |
|
|
74GTLP22034DGGRE4IC 8BIT REGISTER TXRX 48-TSSOP Texas Instruments |
0 | - |
|
数据表 |
74GTLP | 48-TFSOP (0.240", 6.10mm Width) | Tape & Reel (TR) | Obsolete | LVTTL-TO-GTLP Adjustable-Edge-Rate Registered Transceiver | 3.15V ~ 3.45V | -40°C ~ 85°C | - | - | Surface Mount | 48-TSSOP | 8 |
|
SN74S1053DBRIC 16BIT BUS TERM ARRAY 20SSOP Texas Instruments |
0 | - |
|
数据表 |
74S | 20-SSOP (0.209", 5.30mm Width) | Tape & Reel (TR) | Active | Schottky Barrier Diode Bus-Termination Array | - | 0°C ~ 70°C | - | - | Surface Mount | 20-SSOP | 16 |
|
74LVTH182504APMG4IC 20BIT UNIV BUS TXRX 64-LQFP Texas Instruments |
0 | - |
|
数据表 |
74LVTH | 64-LQFP | Tray | Discontinued at Digi-Key | ABT Scan Test Device With Universal Bus Transceivers | 2.7V ~ 3.6V | -40°C ~ 85°C | - | - | Surface Mount | 64-LQFP (10x10) | 20 |
|
SN74BCT8374ADWRIC SCAN TEST DEVICE W/FF 24-SOIC Texas Instruments |
0 | - |
|
数据表 |
74BCT | 24-SOIC (0.295", 7.50mm Width) | Tape & Reel (TR) | Obsolete | Scan Test Device with D-Type Edge-Triggered Flip-Flops | 4.5V ~ 5.5V | 0°C ~ 70°C | - | - | Surface Mount | 24-SOIC | 8 |
|
|
SN74BCT8240ADWRG4IC SCAN TEST DEVICE 24SOIC Texas Instruments |
0 | - |
|
数据表 |
74BCT | 24-SOIC (0.295", 7.50mm Width) | Tape & Reel (TR) | Obsolete | Scan Test Device with Inverting Buffers | 4.5V ~ 5.5V | 0°C ~ 70°C | - | - | Surface Mount | 24-SOIC | 8 |
|
|
SN74BCT8373ADWRG4IC SCAN TEST DEVICE 24SOIC Texas Instruments |
0 | - |
|
数据表 |
74BCT | 24-SOIC (0.295", 7.50mm Width) | Tape & Reel (TR) | Obsolete | Scan Test Device with D-Type Latches | 4.5V ~ 5.5V | 0°C ~ 70°C | - | - | Surface Mount | 24-SOIC | 8 |
|
|
SN74BCT8374ADWRG4IC SCAN TEST DEVICE 24SOIC Texas Instruments |
0 | - |
|
数据表 |
74BCT | 24-SOIC (0.295", 7.50mm Width) | Tape & Reel (TR) | Obsolete | Scan Test Device with D-Type Edge-Triggered Flip-Flops | 4.5V ~ 5.5V | 0°C ~ 70°C | - | - | Surface Mount | 24-SOIC | 8 |
|
SN74ABT8543DWRIC SCAN TEST DEVICE 28-SOIC Texas Instruments |
0 | - |
|
数据表 |
74ABT | 28-SOIC (0.295", 7.50mm Width) | Tape & Reel (TR) | Obsolete | Scan Test Device with Registered Bus Transceiver | 4.5V ~ 5.5V | -40°C ~ 85°C | - | - | Surface Mount | 28-SOIC | 8 |
|
|
SN74ABT8646DWRIC SCAN TEST DEVICE 28-SOIC Texas Instruments |
0 | - |
|
数据表 |
74ABT | 28-SOIC (0.295", 7.50mm Width) | Tape & Reel (TR) | Obsolete | Scan Test Device with Bus Transceiver and Registers | 4.5V ~ 5.5V | -40°C ~ 85°C | - | - | Surface Mount | 28-SOIC | 8 |
