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特殊逻辑
| 图片 | 厂商料号 | 库存情况 | 价格 | 数量 | 数据表 | 系列 | 封装/外壳 | 包装 | 产品状态 | 逻辑类型 | 电源电压 | 工作温度 | 等级 | 认证 | 安装类型 | 供应商设备封装 | 位数 |
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
|
SN74LVTH18504APMRIC 20BIT SCAN TST DEV UBT 64LQFP Texas Instruments |
0 | - |
|
数据表 |
74LVTH | 64-LQFP | Tape & Reel (TR) | Active | ABT Scan Test Device With Universal Bus Transceivers | 2.7V ~ 3.6V | -40°C ~ 85°C | - | - | Surface Mount | 64-LQFP (10x10) | 20 |
|
|
SN74LVTH182502APMRIC SCAN-TEST-DEV/TRANSCVR 64LQFP Texas Instruments |
32 | - |
|
数据表 |
74LVTH | 64-LQFP | Tape & Reel (TR) | Active | ABT Scan Test Device With Universal Bus Transceivers | 2.7V ~ 3.6V | -40°C ~ 85°C | - | - | Surface Mount | 64-LQFP (10x10) | 18 |
|
SN74ABTH16460DLRIC REGISTERED TRANSCVR 56SSOP Texas Instruments |
0 | - |
|
数据表 |
74ABTH | 56-BSSOP (0.295", 7.50mm Width) | Tape & Reel (TR) | Obsolete | 4-TO-1 Multiplexed/Demultiplexed Transceivers | 4.75V ~ 5.5V | -40°C ~ 85°C | - | - | Surface Mount | 56-SSOP | 5 |
|
SN74LVT8980ADWRIC TEST-BUS CONTROLLER 24-SOIC Texas Instruments |
0 | - |
|
数据表 |
74LVT | 24-SOIC (0.295", 7.50mm Width) | Tape & Reel (TR) | Active | Embedded Test-Bus Controllers | 2.7V ~ 3.6V | -40°C ~ 85°C | - | - | Surface Mount | 24-SOIC | 8 |
|
SN74SSTU32864DZKERIC 25BIT CONFIG REG BUFF 96-BGA Texas Instruments |
634 | - |
|
数据表 |
- | 96-LFBGA | Tape & Reel (TR) | Obsolete | 1:1, 1:2 Configurable Registered Buffer | 1.7V ~ 1.9V | 0°C ~ 70°C | - | - | Surface Mount | 96-PBGA MICROSTAR (13.6x5.6) | 25, 14 |
|
SN74SSTV32852ZKFRIC BUFFER 24BIT-48BIT 114BGA Texas Instruments |
0 | - |
|
数据表 |
74SSTV | 114-LFBGA | Tape & Reel (TR) | Obsolete | Registered Buffer with SSTL_2 Compatible I/O for DDR | 2.3V ~ 2.7V | 0°C ~ 70°C | - | - | Surface Mount | 114-BGA MICROSTAR (16x5.5) | 24, 48 |
|
|
SN74ABT18640DLIC SCAN-TEST-DEV/TXRX 56-SSOP Texas Instruments |
0 | - |
|
数据表 |
74ABT | 56-BSSOP (0.295", 7.50mm Width) | Bulk | Active | Scan Test Device with Inverting Bus Transceivers | 4.5V ~ 5.5V | -40°C ~ 85°C | - | - | Surface Mount | 56-SSOP | 18 |
|
SN74ABT8652DWIC SCAN TEST DEVICE 28-SOIC Texas Instruments |
0 | - |
|
数据表 |
74ABT | 28-SOIC (0.295", 7.50mm Width) | Bulk | Active | Scan Test Device with Bus Transceiver and Registers | 4.5V ~ 5.5V | -40°C ~ 85°C | - | - | Surface Mount | 28-SOIC | 8 |
|
SN74ABT8652DLIC SCAN-TEST-DEV/XCVR 28-SSOP Texas Instruments |
0 | - |
|
数据表 |
74ABT | 28-BSSOP (0.295", 7.50mm Width) | Bulk | Active | Scan Test Device with Bus Transceiver and Registers | 4.5V ~ 5.5V | -40°C ~ 85°C | - | - | Surface Mount | 28-BSSOP | 8 |
|
|
SN74BCT8245ADWIC SCAN TEST DEVICE TXRX 24-SOIC Texas Instruments |
0 | - |
|
数据表 |
74BCT | 24-SOIC (0.295", 7.50mm Width) | Bulk | Obsolete | Scan Test Device with Bus Transceivers | 4.5V ~ 5.5V | 0°C ~ 70°C | - | - | Surface Mount | 24-SOIC | 8 |
